INCREASING METROLOGICAL AUTONOMY OF IN-PLANT MEASURING SYSTEMS
 
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Department of Metrology, Standardization and Certification, Lviv Polytechnic National University, Karpinskyy Str. 1, 79013, Lviv, Ukraine
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Department of Specialized Computer Systems, Lviv Politechnic National University, Karpinskyy Str. 1, 79013, Lviv, Ukraine
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Department of Information-Measuring Engineering, Lviv Polytechnic National University, Karpinskyy Str. 1, 79013, Lviv, Ukraine
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School of Computer Science, Hubei University of Technology, Hubei, China
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Department of Information-Measuring Engineering, Lviv Polytechnic National University, Karpinskyy Str. 1, 79013, Lviv, Ukraine.
CORRESPONDING AUTHOR
Orest Kochan   

Department of Information-Measuring Engineering, Lviv Polytechnic National University, Karpinskyy Str. 1, 79013, Lviv, Ukraine
Publication date: 2016-12-01
 
Adv. Sci. Technol. Res. J. 2016; 10(32):193–197
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ABSTRACT
The authors offer to solve the problem of providing traceability of measurements by increasing metrological autonomy of in-plant measuring systems. The paper shows the expedience of increasing metrological autonomy by creating a "virtual" reference. There are analysed possible variants of implementation of the "virtual" reference, which will provide high metrological stability of measurements at insignificant additional expenses. The authors point out the necessity of creation of universal technical and programmatic means of mutual comparison for the in-plant measuring systems to increase the reliability of measurements in the conditions of metrological autonomy.